浙江电力

2021, v.40;No.303(07) 37-44

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110~500 kV隔离开关缺陷率统计分析研究
Statistical Analysis and Research on Defect Rate of 110~500 kV Disconnectors

李斐然,王威,王绍安,池伟,刘秩锋,程养春
LI Feiran,WANG Wei,WANG Shaoan,CHI Wei,LIU Zhifeng,CHENG Yangchun

摘要(Abstract):

为了便于开展隔离开关运维管理以及状态检修工作,需要掌握隔离开关运行过程中详细准确的缺陷信息。以某省1980—2019年隔离开关台账数据及缺陷数据为基础,从不同维度计算了隔离开关的总缺陷率和年缺陷率,依据可靠性理论,采用Weibull分布函数对年缺陷率进行拟合;统计了隔离开关每种缺陷部件和每种缺陷类型的占比及其随运行时间发生的变化,并根据Arrhenius模型和Coffin-Mason模型将设备年缺陷率与隔离开关的部分特征量关联起来,从而解释老化缺陷产生的原因。研究结果表明,不同维度下隔离开关总缺陷率略有不同,年缺陷率变化趋势基本与浴盆曲线的二、三阶段相似,机构箱为缺陷占比最高的部件,异常发热、操作卡涩为隔离开关占比较高的缺陷类型。
To carry out the operation and maintenance management and condition-based maintenance of disconnectors, it is necessary to master the detailed and accurate defect information during the operation of the disconnectors. Based on the account data and defect data of disconnectors in a province between 1980 and2019, the total defect rate and annual defect rate of disconnectors were calculated in different dimensions.According to the reliability theory, the Weibull distribution function was used to fit the annual defect rate.Then the proportion of each defect component and each defect type of the disconnector and its change with the operation time were counted. According to the Arrhenius model and Coffin-Mason model, the annual defect rate of the equipment was correlated with some characteristic quantities of the disconnector, to clarify the reasons for the aging defects of the equipment. The results showed that the total defect rates in different dimensions are slightly different, and the trend of annual defect rate is similar to the second and third stages of the bathtub curve. The mechanism box is the component with the highest defect proportion, and abnormal heating and operation jams are the major defects.

关键词(KeyWords): 隔离开关;缺陷率;Weibull分布;缺陷类型;老化模型
disconnector;defect rate;Weibull distribution;defect types;aging model

Abstract:

Keywords:

基金项目(Foundation): 国网浙江省电力有限公司科技项目(5211DS19003D)

作者(Author): 李斐然,王威,王绍安,池伟,刘秩锋,程养春
LI Feiran,WANG Wei,WANG Shaoan,CHI Wei,LIU Zhifeng,CHENG Yangchun

DOI: 10.19585/j.zjdl.202107007

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