不同盐密、灰密下XP-160绝缘子串交流闪络特性研究Influence of ESDD and NSDD on AC Flashover Characteristic of Artificially Polluted XP-160 Insulators
梅冰笑,叶自强
MEI Bing-xiao,YE Zi-qiang
摘要(Abstract)：
选择7片串XP-160瓷绝缘子为试品,在人工雾室研究了灰密(NSDD)和盐密(ESDD)对XP-160绝缘子污秽闪络特性的影响,分析了NSDD的影响原因,并采用2种方法对试验数据进行了分析和拟合,得到了XP-160绝缘子污闪电压Uf与ESDD和NSDD的相互关系。
A lot of laboratory experiments are carried out on polluted XP-160 insulator string of 7 units in the artificial fog cabinet.Based on the test results,the effects of both ESDD and NSDD on the AC flashover voltage of the artificial polluted XP-160 insulators are also analyzed.
关键词(KeyWords)：
绝缘子;灰密;盐密;闪络电压
insulator;NSDD;ESDD;flashover voltage
基金项目(Foundation):
作者(Author):
梅冰笑,叶自强
MEI Bing-xiao,YE Zi-qiang
DOI: 10.19585/j.zjdl.2008.06.004
参考文献(References)：
- CIGRE work group C4-13.IEC60815NP Selection and Di-mensioning of High-voltage Insulators for PollutedCondi-tions-Part1:Definitions,information and General Principles[S].2004.
- CIGRE work group C4-13.IEC60815NP Selection andDi-mensioning of High-voltage Insulators for Polluted Condi-tions-Part2:Ceramic and glass insulators for ACsystem[S].2004.
- 宿志一.用饱和盐密确定污秽等级及绘制污区分布图的探讨[J].电网技术,2004,28(8):16-19.
- 霍万龙.绝缘子污秽等级测量方法选择[J].东北电力技术,2002(3):23-25.
- 江秀臣,安玲,韩振东.等值盐密现场测量方法的研究[J].中国电机工程学报,2000,20(4):40-49.
- 吴光亚,钱之银,肖勇,等.防污闪技术的现状与发展趋势[J].电力设备.2005,6(3):5-9.
- 吴光亚,蔡炜,卢燕龙,等.交流输电线路绝缘子串片数的选择,高电压技术[J].2002,28(2):21-23.
- Sundararajan R,Gorur RS.Influence of Inert Materials on The Pollution Flashover Voltage of Porcelain Insulators[R].Conference on Electrical Insulation and Dielectric Phenome-na.1994:651-656.